Genome-wide association study reveals novel genomic regions for grain yield and yield-related traits in drought-stressed synthetic hexaploid wheat
Type:
Title:
Genome-wide association study reveals novel genomic regions for grain yield and yield-related traits in drought-stressed synthetic hexaploid wheat
Author:
Bhatta, M.R.;
https://orcid.org/0000-0002-4959-0481
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Morgounov, A.I.;
Belamkar, V.;
Baenziger, P.S.
https://orcid.org/0000-0002-9109-6954
URL Profile
http://agronomy.unl.edu/web/agronomy/grains Items in this Repository
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Bhatta, M.R.

www.researchgate.net/profile/Madhav_Bhatta2 Items in this Repository
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Morgounov, A.I.;

Belamkar, V.;
Baenziger, P.S.
Baenziger, P.S.

http://agronomy.unl.edu/web/agronomy/grains Items in this Repository
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Year:
2018
Copyright:
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Journal:
Journal of Molecular Sciences
Journal volume:
19
Journal issue:
10, art. 3011
DOI:
Place of Publication:
Basel, Switzerland
Publisher:
MDPI
Citation:
Genome-wide association study reveals novel genomic regions for grain yield and yield-related traits in drought-stressed synthetic hexaploid wheat. 2018. Bhatta, M.R.; Morgounov, A.I.; Belamkar, V.; Baenziger, P.S. 19 (10, art. 3011) DOI: 10.3390/ijms19103011 MDPI.