Mostrando ítems 1-10 de 10
Fourth annual progress report: Year 2003. Evaluation of cropping systems on the development of wheat pathogens and research for better resistance to foliar blights. The non-specific foliar wheat pathogens. Phase II
This report presents the results of trials and research conducted with the support of DGCD during the fourth year of this co1laborative project between CIMMYT South Asia and UCL (Université catholique de Louvain). The goal ...
Genetic analysis of field resistance to tan spot in spring wheat
Tan spot, caused by Pyrenophora tritici-repentis (Died.) Drechs., is an important constraint to wheat (Triticum aestivum L.) yield in many countries. Since the inheritance of field resistance to tan spot is poorly understood, ...
Comparative analyses of spot blotch and tan spot epidemics on wheat under optimum and late sowing period in South Asia
In South Asia, foliar blight of wheat (Triticum aestivum L.) is a disease complex caused by Cochliobolus sativus (the spot blotch pathogen) and Pyrenophora tritici-repentis (the tan spot pathogen) which can reduce yields ...
Evaluation of CIMMYT germplasm for resistance to leaf spotting diseases of wheat
The leaf spotting disease complex is a major biotic constrain in enhancing grain production in the major wheat growing regions. Two leaf spotting diseases, tan spot, caused by an ascomycete fungus Pyrenophora tritici-repentis, ...