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Article
Genome-wide association for grain yield under rainfed conditions in historical wheat cultivars from Pakistan
(Frontiers, 2015)
Genome-wide association studies (GWAS) were undertaken to identify SNP markers associated with yield and yield-related traits in 123 Pakistani historical wheat cultivars evaluated during 2011–2014 seasons under rainfed ...
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Genetic gain from phenotypic and genomic selection for quantitative resistance to stem rust of wheat
(Crop Science Society of America, 2015)
Stem rust of wheat (Triticum aestivum L.) caused by Puccinia graminis f. sp. tritici Eriks. and E. Henn. is a globally important disease that can cause severe yield loss. Breeding for quantitative stem rust resistance ...
Article
Genome-wide association study reveals novel genomic regions for grain yield and yield-related traits in drought-stressed synthetic hexaploid wheat
(MDPI, 2018)
Synthetic hexaploid wheat (SHW; 2n = 6x = 42, AABBDD, Triticum aestivum L.) is produced from an interspecific cross between durum wheat (2n = 4x = 28, AABB, T. turgidum L.) and goat grass (2n = 2x = 14, DD, Aegilops tauschii ...
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Fine mapping of leaf rust resistance gene Lrzh84 using expressed sequence tag and sequence-tagged site markers, and allelism with other genes on wheat chromosome 1b
(American Phytopathological Society (APS), 2013)
Zhou 8425B, possessing the leaf rust resistance gene LrZH84, is an elite wheat (Triticum aestivum) parental line in the Yellow-Huai Valley region of China. In the present study, 2,086 F2 plants derived from Zhou 8425B/Chinese ...
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First report of Fusarium hostae causing crown rot on wheat (Triticum spp.) in Turkey
(American Phytopathological Society (APS), 2016)
Crown rot disease of wheat is caused by a complex of Fusarium species. To identify species associated with crown rot in Turkey, crowns and stems of bread wheat (Triticum aestivum L.) and durum wheat (T. durum Desf.) were ...
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Molecular marker mapping of Leaf Rust resistance gene Lr46 and its association with Strip Rust resistance gene Yr29 in wheat
(American Phytopathological Society (APS), 2003)
Leaf and stripe rusts, caused by Puccinia triticina and P. striiformis, respectively, are globally important fungal diseases of wheat that cause significant annual yield losses. A gene that confers slow rusting resistance ...
Article
Crop breeding chips and genotyping platforms: progress, challenges, and perspectives
(Elsevier, 2017)
There is a rapidly rising trend in the development and application of molecular marker assays for gene mapping and discovery in field crops and trees. Thus far, more than 50 SNP arrays and 15 different types of ...