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Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize


Type:
Article
Title:
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
Author:
Junqiang Ding;
Farhan Ali;
Gengshen Chen;
Huihui Li;
ORCID iD icon
Huihui Li
ORCID iD iconhttps://orcid.org/0000-0002-9117-5011
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Mahuku, G.;
Mahuku, G.
ORCID iD iconhttps://orcid.org/0000-0001-8444-8651
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Ning Yang;
Ning Yang
ORCID iD iconhttps://orcid.org/0000-0002-6354-3534
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Narro, L.;
Magorokosho, C.;
ORCID iD icon
Magorokosho, C.
ORCID iD iconhttps://orcid.org/0000-0003-3177-1791
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Makumbi, D.;
ORCID iD icon
Makumbi, D.
ORCID iD iconhttps://orcid.org/0000-0002-1801-5986
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Jianbing Yan
Jianbing Yan
ORCID iD iconhttps://orcid.org/0000-0001-8650-7811
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Year:
2015
URI:
http://hdl.handle.net/10883/4514
Copyright:
CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Journal:
BMC Plant Biology
Journal volume:
15
Pages:
206
DOI:
10.1186/s12870-015-0589-z
Place of Publication:
United Kingdom
Publisher:
BioMed Central
Citation:
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize. 2015. Junqiang Ding; Farhan Ali; Gengshen Chen; Huihui Li; Mahuku, G.; Ning Yang; Narro, L.; Magorokosho, C.; Makumbi, D.; Jianbing Yan. 15 DOI: 10.1186/s12870-015-0589-z BioMed Central.

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