Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
Type:
Title:
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
Author:
Junqiang Ding;
Farhan Ali;
Gengshen Chen;
Huihui Li;
Mahuku, G.;
Ning Yang;
Narro, L.;
Magorokosho, C.;
Makumbi, D.;
Jianbing Yan
Farhan Ali;
Gengshen Chen;
Huihui Li;

Mahuku, G.;
Ning Yang;
Narro, L.;
Magorokosho, C.;

Makumbi, D.;

Jianbing Yan
Year:
2015
Copyright:
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Journal:
BMC Plant Biology
Journal volume:
15
Pages:
206
Place of Publication:
United Kingdom
Publisher:
BioMed Central
Citation:
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize. 2015. Junqiang Ding; Farhan Ali; Gengshen Chen; Huihui Li; Mahuku, G.; Ning Yang; Narro, L.; Magorokosho, C.; Makumbi, D.; Jianbing Yan. 15 DOI: 10.1186/s12870-015-0589-z BioMed Central.