Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
Tipo:
Título:
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
Autor:
Junqiang Ding;
Farhan Ali;
Gengshen Chen;
Huihui Li;
Mahuku, G.;
Ning Yang;
Narro, L.;
Magorokosho, C.;
Makumbi, D.;
Jianbing Yan
Farhan Ali;
Gengshen Chen;
Huihui Li;
Mahuku, G.;
Ning Yang;
Narro, L.;
Magorokosho, C.;
Makumbi, D.;
Jianbing Yan
Año:
2015
Copyright:
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Revista:
BMC Plant Biology
Volumen de la Revista:
15
Número de artículo:
206
Lugar de publicación:
United Kingdom
Editor:
BioMed Central
Cita:
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize. 2015. Junqiang Ding; Farhan Ali; Gengshen Chen; Huihui Li; Mahuku, G.; Ning Yang; Narro, L.; Magorokosho, C.; Makumbi, D.; Jianbing Yan. 15 DOI: 10.1186/s12870-015-0589-z BioMed Central.