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Spot Blotch continues to cause substantial grain yield reductions under resource-limited farming conditions

Autor: Sharma, R.C.
Autor: Duveiller, E.
Año: 2006
Lenguaje: English
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Tipo: Article
Región: South Asia
Paginas: 482-488
No de Revista: 07-ago
Revista: Journal of Phytopathology
Volumen de la Revista: 154

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  • Wheat
    Wheat - breeding, phytopathology, physiology, quality, biotech

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