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Spot Blotch continues to cause substantial grain yield reductions under resource-limited farming conditions

Author: Sharma, R.C.
Author: Duveiller, E.
Year: 2006
URI: http://hdl.handle.net/10883/2499
Language: English
Copyright: CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Type: Article
Region: South Asia
Pages: 482-488
Journal issue: 07-ago
Journal: Journal of Phytopathology
Journal volume: 154


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  • Wheat
    Wheat - breeding, phytopathology, physiology, quality, biotech

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