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Estimation of grain yield by near-infrared reflectance spectroscopy in durum wheat

Author: Ferrio, J.P.
Author: Bertran, E.
Author: Nachit, M.M.
Author: Catala, J.
Author: Araus, J.L.
Year: 2004
URI: http://hdl.handle.net/10883/2384
Language: English
Copyright: CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Type: Article
Region: Global
Pages: 373-380
Journal: Euphytica
Journal volume: 137
Keywords: Seed product
Keywords: Wheat
Keywords: Quality
Keywords: Growth rate
Keywords: Irrigation
Keywords: Rainfed farming
Keywords: Environmental conditions
Keywords: Spectrometry


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  • Wheat
    Wheat - breeding, phytopathology, physiology, quality, biotech

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