Mostrar el registro sencillo del ítem

Estimation of grain yield by near-infrared reflectance spectroscopy in durum wheat

Autor: Ferrio, J.P.
Autor: Bertran, E.
Autor: Nachit, M.M.
Autor: Catala, J.
Autor: Araus, J.L.
Año: 2004
URI: http://hdl.handle.net/10883/2384
URI: http://hdl.handle.net/10883/2384
Lenguaje: English
Copyright: CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Tipo: Article
Región: Global
Paginas: 373-380
Revista: Euphytica
Volumen de la Revista: 137
Palabras Claves: Seed product
Palabras Claves: Wheat
Palabras Claves: Quality
Palabras Claves: Growth rate
Palabras Claves: Irrigation
Palabras Claves: Rainfed farming
Palabras Claves: Environmental conditions
Palabras Claves: Spectrometry


Ficheros en el ítem

Thumbnail

Este ítem aparece en la(s) siguiente(s) colección(ones)

  • Wheat
    Wheat - breeding, phytopathology, physiology, quality, biotech

Mostrar el registro sencillo del ítem