Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
Type:
Title:
Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
Creator:
Juliana, P.;
Xinyao He;
Poland, J.;
Shrestha, S.;
Joshi, A.K.;
Huerta-Espino, J.;
https://orcid.org/0000-0001-8334-9862
Scopus ID
Researcher ID
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Velu, G.;
Crespo Herrera, L.A.;
Mondal, S.;
Kumar, U.;
Bhati, P.K.;
Vishwakarma, M.K.;
Singh, R.P.;
Singh, P.K.
Xinyao He;
Poland, J.;
Shrestha, S.;
Joshi, A.K.;
Huerta-Espino, J.;
Huerta-Espino, J.
https://orcid.org/0000-0001-8334-9862
Scopus ID
Researcher ID
Items in this Repository
View
Velu, G.;
Crespo Herrera, L.A.;
Mondal, S.;
Kumar, U.;
Bhati, P.K.;
Vishwakarma, M.K.;
Singh, R.P.;
Singh, P.K.
Year:
2022
Copyright:
CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose
Journal:
Frontiers in Plant Science
Journal volume:
13
Article number:
835095
Place of Publication:
Switzerland
Publisher:
Frontiers
