Multitrait, random regression, or simple repeatability model in high-throughput phenotyping data improve genomic prediction for wheat grain yield
Type:
Title:
Multitrait, random regression, or simple repeatability model in high-throughput phenotyping data improve genomic prediction for wheat grain yield
Creator:
Jin Sun;
Rutkoski, J.;
Poland, J.A.;
Crossa, J.;
Jannink, J.L.;
Sorrells, M.E.
Rutkoski, J.;
Poland, J.A.;
Crossa, J.;
Jannink, J.L.;
Sorrells, M.E.
Year:
2017
Copyright:
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Journal:
The Plant Genome
Journal volume:
10
Journal issue:
2
Pages:
1-12
Place of Publication:
Madison, WI (USA)
Publisher:
CSSA :; Wiley
