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Characterization of QTLs for seedling resistance to tan spot and Septoria nodorum blotch in the PBW343/Kenya Nyangumi wheat recombinant inbred lines population


Type:
Article
Title:
Characterization of QTLs for seedling resistance to tan spot and Septoria nodorum blotch in the PBW343/Kenya Nyangumi wheat recombinant inbred lines population
Author:
Singh, P.K.;
ORCID iD icon
Singh, P.K.
ORCID iD iconhttps://orcid.org/0000-0003-4610-3120
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Sukhwinder-Singh;
Zhiying Deng;
Zhiying Deng
ORCID iD iconhttps://orcid.org/0000-0002-8557-2619
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Xinyao He;
ORCID iD icon
Xinyao He
ORCID iD iconhttps://orcid.org/0000-0003-0217-9510
ScopusScopus ID
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Kehel, Z.;
Kehel, Z.
ORCID iD iconhttps://orcid.org/0000-0002-1625-043X
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Singh, R.P.
ORCID iD icon
Singh, R.P.
ORCID iD iconhttps://orcid.org/0000-0002-4676-5071
ScopusScopus ID
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Year:
2019
Copyright:
CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Journal:
International Journal of Molecular Sciences
Journal volume:
20
Journal issue:
21; art. 5432
DOI:
10.3390/ijms20215432
Place of Publication:
Basel (Switzerland)
Publisher:
MDPI
Citation:
Characterization of QTLs for seedling resistance to tan spot and Septoria nodorum blotch in the PBW343/Kenya Nyangumi wheat recombinant inbred lines population. 2019. Singh, P.K.; Sukhwinder-Singh; Zhiying Deng; Xinyao He; Kehel, Z.; Singh, R.P. 20 (21)(art. 5432) DOI: 10.3390/ijms20215432 MDPI.

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  • Wheat

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