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Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat : heritability estimates and marker-trait associations

Author: Caiyun Liu
Author: Pinto Espinosa, F.
Author: Cossani, C.M.
Author: Sukumaran, S.
Author: Reynolds, M.P.
Year: 2019
ISSN: 2095-7505 (Print)
Language: English
Publisher: Higher Education Press
Copyright: CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Type: Article
Place: Beijing (China)
Pages: 296-308
Journal issue: 3
Journal: Frontiers of Agricultural Science and Engineering
Journal volume: 6
DOI: 10.15302/J-FASE-2019269
Agrovoc: GENOMES

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  • Wheat
    Wheat - breeding, phytopathology, physiology, quality, biotech

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