Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations
Type:
Title:
Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations
Author:
Caiyun Liu;
Pinto Espinosa, F.;
Cossani, C.M.;
Sukumaran, S.;
https://orcid.org/0000-0003-4088-4624
Scopus ID
Google Scholar
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Reynolds, M.P.
https://orcid.org/0000-0002-4291-4316
Scopus ID
Researcher ID
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Pinto Espinosa, F.;

Cossani, C.M.;
Sukumaran, S.;

Sukumaran, S.



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Reynolds, M.P.

Reynolds, M.P.



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Year:
2019
Copyright:
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Journal:
Frontiers of Agricultural Science and Engineering
Journal volume:
6
Journal issue:
3
Pages:
296-308
Place of Publication:
Beijing (China)
Publisher:
Higher Education Press
Citation:
Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations. 2019. Caiyun Liu; Pinto Espinosa, F.; Cossani, C.M.; Sukumaran, S.; Reynolds, M.P. 6 (3) DOI: 10.15302/J-FASE-2019269 Higher Education Press.