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Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations


Type:
Article
Title:
Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations
Author:
Caiyun Liu;
Caiyun Liu
ORCID iD iconhttps://orcid.org/0000-0001-7987-703X
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Pinto Espinosa, F.;
ORCID iD icon
Pinto Espinosa, F.
ORCID iD iconhttps://orcid.org/0000-0003-3000-9084
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Cossani, C.M.;
Cossani, C.M.
ORCID iD iconhttps://orcid.org/0000-0001-6807-8777
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Sukumaran, S.;
ORCID iD icon
Sukumaran, S.
ORCID iD iconhttps://orcid.org/0000-0003-4088-4624
ScopusScopus ID
scholarGoogle Scholar
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Reynolds, M.P.
ORCID iD icon
Reynolds, M.P.
ORCID iD iconhttps://orcid.org/0000-0002-4291-4316
ScopusScopus ID
researcheridResearcher ID
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Year:
2019
Copyright:
CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Journal:
Frontiers of Agricultural Science and Engineering
Journal volume:
6
Journal issue:
3
Pages:
296-308
DOI:
10.15302/J-FASE-2019269
Place of Publication:
Beijing (China)
Publisher:
Higher Education Press
Citation:
Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations. 2019. Caiyun Liu; Pinto Espinosa, F.; Cossani, C.M.; Sukumaran, S.; Reynolds, M.P. 6 (3) DOI: 10.15302/J-FASE-2019269 Higher Education Press.

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Genetic ResourcesInstitutionalIntegrated DevelopmentMaizeSocioeconomicsSustainable IntensificationWheat

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