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Genetics of leaf rust and stripe rust resistance in spring wheat cultivar ‘Kijil’

Author: Sandoval-Sanchez, M.
Author: Huerta-Espino, J.
Author: Singh, R.
Author: Caixia Lan
Author: Bhavani, S.
Author: Rojas Martínez, R.I.
Author: Benitez Riquelme, I.
Author: Nava Díaz, C.
Author: Randhawa, M.S.
Year: 2018
URI: https://hdl.handle.net/10883/19929
Abstract: Leaf rust and stripe rust caused by the fungi Puccinia triticina and P. striiformis f. sp. tritici, respectively, are important diseases of wheat and represent a significant threat in most wheat producing regions worldwide. Growing resistant varieties and the identification and characterization of new sources of resistance are necessary to combat the threat from the evolving pathogen population. Bread wheat (Triticum aestivum L.) line ‘Kijil’ developed at CIMMYT showed adult plant resistance (APR) to leaf rust (LR) and stripe rust (YR).
Format: PDF
Language: English
Publisher: CIMMYT
Publisher: INIFAP
Publisher: COLPOS
Copyright: CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Type: Conference Poster
Place of Publication: Mexico
Pages: 1 page
Keywords: Durum Wheat
Agrovoc: SOFT WHEAT
Agrovoc: HARD WHEAT
Agrovoc: RUSTS
dc.suppress.: 0


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  • Wheat
    Wheat - breeding, phytopathology, physiology, quality, biotech

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