Genome-wide association mapping for leaf tip necrosis and pseudo-black chaff in relation to durable rust resistance in wheat
Tipo:
Título:
Genome-wide association mapping for leaf tip necrosis and pseudo-black chaff in relation to durable rust resistance in wheat
Autor:
Juliana, P.;
Rutkoski, J.E.;
Poland, J.A.;
Singh, R.P.;
Murugasamy, S.;
Natesan, S.;
Barbier, H.;
Sorrells, M.E.
Rutkoski, J.E.;
Poland, J.A.;
Singh, R.P.;
Murugasamy, S.;
Natesan, S.;
Barbier, H.;
Sorrells, M.E.
Año:
2015
Copyright:
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Revista:
The Plant Genome
Volumen de la Revista:
8
No de Revista:
2
Lugar:
United States
Editor:
Crop Science Society of America
Cita:
Genome-wide association mapping for leaf tip necrosis and pseudo-black chaff in relation to durable rust resistance in wheat. 2015. Juliana, P.; Rutkoski, J.E.; Poland, J.A.; Singh, R.P.; Murugasamy, S.; Natesan, S.; Barbier, H.; Sorrells, M.E.. The Plant Genome 8 (2) DOI: 10.3835/plantgenome2015.01.0002 United States. Crop Science Society of America.
