Combining ability analysis of RILs developed from a YML32 × Q11 cross for grain yield and resistance to gray leaf spot
Type:
Title:
Combining ability analysis of RILs developed from a YML32 × Q11 cross for grain yield and resistance to gray leaf spot
Author:
Li, Z.W.;
Liu, L.;
Zhang, Y.D.;
Jeffers, D.P.;
Kang, M.S.;
Fan, X.M.
Liu, L.;
Zhang, Y.D.;
Jeffers, D.P.;

Kang, M.S.;
Fan, X.M.
Year:
2018
Copyright:
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Journal:
Crop Science
Journal volume:
58
Journal issue:
3
Pages:
1070-1081
Place of Publication:
Madison, Wis.
Publisher:
Crop Science Society of America (CSSA)
Citation:
Combining ability analysis of RILs developed from a YML32 × Q11 cross for grain yield and resistance to gray leaf spot. 2018. Li, Z.W.; Liu, L.; Zhang, Y.D.; Jeffers, D.P.; Kang, M.S.; Fan, X.M. 58 (3) DOI: 10.2135/cropsci2017.04.0228 Crop Science Society of America (CSSA).