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Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and tan spot resistance in wheat

Author: Juliana, P.
Author: Singh, R.P.
Author: Singh, P.K.
Author: Crossa, J.
Author: Rutkoski, J.
Author: Poland, J
Author: Bergstrom, G.C
Author: Sorrells, M.E.
Year: 2017
ISSN: 1940-3372
ISSN: 1940-3372
URI: https://hdl.handle.net/10883/19349
Format: PDF
Language: English
Publisher: Crop Science Society of America
Copyright: CIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
Type: Article
Place of Publication: U.S.
Issue: 2
Volume: 10
DOI: 10.3835/plantgenome2016.08.0082
Agrovoc: WHEAT
Agrovoc: GENOMES
Agrovoc: SEPTORIA
Agrovoc: STAGONOSPORA
Agrovoc: WHEAT
Agrovoc: GENOMES
Agrovoc: SEPTORIA
Agrovoc: STAGONOSPORA
Journal: The Plant Genome


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  • Wheat
    Wheat - breeding, phytopathology, physiology, quality, biotech

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