Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and tan spot resistance in wheat
Tipo:
Título:
Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and tan spot resistance in wheat
Autor:
Juliana, P.;
Singh, R.P.;
Singh, P.K.;
Crossa, J.;
Rutkoski, J.;
Poland, J;
Bergstrom, G.C;
Sorrells, M.E.

Singh, R.P.;

Singh, P.K.;

Crossa, J.;

Rutkoski, J.;
Poland, J;
Bergstrom, G.C;
Sorrells, M.E.
Año:
2017
Copyright:
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Revista:
The Plant Genome
Volumen de la Revista:
10
No de Revista:
2
Lugar de publicación:
U.S.
Editor:
Crop Science Society of America
Cita:
Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and tan spot resistance in wheat. 2017. Juliana, P.; Singh, R.P.; Singh, P.K.; Crossa, J.; Rutkoski, J.; Poland, J; Bergstrom, G.C; Sorrells, M.E. 10 (2) DOI: 10.3835/plantgenome2016.08.0082 Crop Science Society of America.