Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and tan spot resistance in wheat
Type:
Title:
Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and tan spot resistance in wheat
Author:
Juliana, P.;
Singh, R.P.;
Singh, P.K.;
Crossa, J.;
Rutkoski, J.;
Poland, J;
Bergstrom, G.C;
Sorrells, M.E.

Singh, R.P.;

Singh, P.K.;

Crossa, J.;

Rutkoski, J.;
Poland, J;
Bergstrom, G.C;
Sorrells, M.E.
Year:
2017
Copyright:
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Journal:
The Plant Genome
Journal volume:
10
Journal issue:
2
Place of Publication:
U.S.
Publisher:
Crop Science Society of America
Citation:
Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and tan spot resistance in wheat. 2017. Juliana, P.; Singh, R.P.; Singh, P.K.; Crossa, J.; Rutkoski, J.; Poland, J; Bergstrom, G.C; Sorrells, M.E. 10 (2) DOI: 10.3835/plantgenome2016.08.0082 Crop Science Society of America.