The present investigation was planned to assess genetic diversity for yield, yield contributing traits and resistance to spot blotch disease of wheat in two hundred exotic germplasm accessions of bread wheat. The germplasm along with 4 checks were evaluated in augmented block design at G.B. Pant University of Agriculture & Technology, Pantnagar during 2013-14. The genotypes were evaluated for eight quantitative traits and spot blotch incidence. The germplasm accessions showed wide variability for the studied traits and these were grouped into different clusters using Non-hierarchical Euclidean cluster analysis. On this basis, 200 wheat accessions were categorized into 8 clusters. The intra cluster distance was maximum for the cluster VII (2.431) and minimum for the cluster VIII (1.813). Inter cluster distance was maximum between cluster I and VIII (7.263) and minimum between cluster III and IV (2.292). So, larger the distance between the clusters better the chances of getting transgressive segregants.