Now showing items 1-10 of 19
Genome-wide association mapping for resistance to leaf rust, stripe rust and tan spot in wheat reveals potential candidate genes
Leaf rust (LR), stripe rust (YR) and tan spot (TS) are some of the important foliar diseases in wheat (Triticum aestivum L.). To identify candidate resistance genes for these diseases in CIMMYT?s (International Maize and ...
Hydrogen peroxide prompted lignification affects pathogenicity of hemi-biotrophic pathogen Bipolaris sorokiniana to wheat
(Korean Society of Plant Pathology, 2019)
Spot blotch caused by Bipolaris sorokiniana has spread to more than 9 million ha of wheat in the warm, humid areas of the Eastern Gangetic Plains (EGP) of South Asia and is a disease of major concern in other similar wheat ...
QTL mapping and transcriptome analysis to identify differentially expressed genes induced by Septoria tritici blotch disease of wheat
Resistance to Septoria tritici blotch (STB) is an economically important trait in many wheat-breeding programs across the world. Several quantitative trait loci (QTL) for STB resistance were identified in wheat but due to ...
A wheat chromosome 5AL region confers seedling resistance to both tan spot and Septoria nodorum blotch in two mapping populations
Tan spot (TS) and Septoria nodorum blotch (SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in grain ...
Natural variation in elicitation of defense-signaling associates to field resistance against the spot blotch disease in bread wheat (Triticum aestivum L.)
Spot blotch, caused by the hemibiotropic fungus Bipolaris sorokiniana, is amongst the most damaging diseases of wheat. Still, natural variation in expression of biochemical traits that determine field resistance to spot ...
Multi-trait and multi-environment QTL analyses for resistance to wheat diseases
(Public Library of Science, 2012)
Background: Stripe rust, leaf rust, tan spot, and Karnal bunt are economically significant diseases impacting wheat production. The objectives of this study were to identify quantitative trait loci for resistance to these ...
Unravelling the complex genetics of karnal bunt (Tilletia indica) resistance in common wheat (Triticum aestivum) by genetic linkage and genome-wide association analyses
(Genetics Society of America, 2019)
Karnal bunt caused by Tilletia indica Mitra [syn. Neovossia indica (Mitra) Mundkur] is a significant biosecurity concern for wheat-exporting countries that are free of the disease. It is a seed-, soil-and air-borne disease ...
Investigation and genome-wide association study for Fusarium crown rot resistance in Chinese common wheat
(BioMed Central, 2019)
Fusarium crown rot (FCR) is a severe and chronic disease in common wheat and is able to cause serious yield loss and health problems to human and livestock. Here, 234 Chinese wheat cultivars were evaluated in four greenhouse ...