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Article
Genome wide association study of karnal bunt resistance in a wheat germplasm collection from Afghanistan
(MDPI, 2019)
Karnal bunt disease of wheat, caused by the fungus Neovossia indica, is one of the most important challenges to the grain industry as it affects the grain quality and also restricts the international movement of infected ...
Article
A wheat chromosome 5AL region confers seedling resistance to both tan spot and Septoria nodorum blotch in two mapping populations
(Elsevier, 2019)
Tan spot (TS) and Septoria nodorum blotch (SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in grain ...
Article
Mapping of genetic loci conferring resistance to leaf rust from three globally resistant durum wheat sources
(Frontiers, 2019)
Genetic resistance in the host plant is the most economical and environmentally friendly strategy for controlling wheat leaf rust, caused by Puccinia triticina Eriks. The durum wheat lines Gaza (Middle East), Arnacoris ...