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Article
Genome wide association study of karnal bunt resistance in a wheat germplasm collection from Afghanistan
(MDPI, 2019)
Karnal bunt disease of wheat, caused by the fungus Neovossia indica, is one of the most important challenges to the grain industry as it affects the grain quality and also restricts the international movement of infected ...
Article
Resistance to spot blotch in two mapping populations of common wheat is controlled by multiple QTL of minor effects
(MDPI, 2018)
Spot blotch (SB) is an important fungal disease of wheat in South Asia and South America. Host resistance is regarded as an economical and environmentally friendly approach of controlling SB, and the inheritance of resistance ...
Article
A wheat chromosome 5AL region confers seedling resistance to both tan spot and Septoria nodorum blotch in two mapping populations
(Elsevier, 2019)
Tan spot (TS) and Septoria nodorum blotch (SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in grain ...